OBIRCH 搜尋引擎推薦回答

OBIRCH - NanoPhysics B.V.

Optical Beam Induced Resistance Change (OBIRCH) is a very powerfull fault localization technique for your Integrated Circuit.

Optical beam induced resistance change (OBIRCH) - IEEE Xplore

Abstract: The OBIRCH is an indispensable failure analysis tool in the semiconductor industry. It is useful not only for test structures but also for final ...

免責聲明

本網站所有資料僅供參考,如使用者依本資料交易發生交易損失需自行負責,本網站對資料內容錯誤﹑更新延誤不負任何責任。